Ferdeghini C., Braccini V., Sarnelli E., Bellingeri E., Kawale S., Buzio R., Gerbi A., Adamo M., Nappi C.
Shahabuddin M., Alzayed N.S., Soltan S., Shah M.S., Parakkandy J.M., Kityk I.V., El-Naggar A., Qaid S.E., Madhar N.A.
Ключевые слова: HTS, YBCO, thin films, irreversibility fields, upper critical fields, fabrication, stress effects, compression, pinning, PLD process, substrate SrTiO3, substrate single crystal, lattice parameter, magnetization, critical caracteristics, critical caracteristics, critical current density
Ключевые слова: HTS, YBCO, films epitaxial, substrate single crystal, texture, milling process, resistive transition, temperature dependence, buffer layers, PLD process
Ключевые слова: HTS, DyBCO, precursors, films thick, screen printing, substrate single crystal, microstructure, texture, magnetization, fabrication
Ferdeghini C., Holzapfel B., Braccini V., Tarantini C., Putti M., Sarnelli E., Reich E., Bellingeri E., Sala A., Kawale S., Buzio R., Gerbi A., Adamo M.
Ключевые слова: chalcogenide, thin films, PLD process, substrate LaAlO3, substrate SrTiO3, substrate single crystal, substrates, critical temperature, fabrication, microstructure, lattice parameter, critical caracteristics, Jc/B curves, anisotropy, comparison, YBCO, grain boundaries, resistive transition, magnetic field dependence, upper critical fields, high field magnets
Ключевые слова: presentation, pnictides, thin films, fabrication, substrate single crystal, substrate metallic, comparison, resistivity, temperature dependence, critical caracteristics, critical current density, critical temperature, composition, lattice parameter, microstructure, Jc/B curves, anisotropy, coated conductors, substrate Hastelloy, IBAD process, experimental results
Ключевые слова: HTS, Bi2212, thin films, substrate single crystal, spin coating process, fabrication, microstructure, chemical solution deposition
Winkler D., Chukharkin M., Kalabukhov A., Snigirev O., Porokhov N., Kashin V.V., Tsvetkov V.B., Rusanov S.Y.
Ключевые слова: HTS, Bi2212, thin films, fabrication, nanodoping, nanoscaled effects, substrate single crystal, PLD process, X-ray diffraction, microstructure, lattice parameter, critical temperature, resistivity, temperature dependence, composition, pinning, critical caracteristics, critical current density, self-field effect, fabrication, experimental results
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